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@ARTICLE{Chiodi2009,
author = {Chiodi, F., Aprili, M., Reulet, B.},
title = {Evidence for two time scales in long SNS junctions},
journal = {Physical Review Letters},
year = {2009},
volume = {103, 177002},
number = {17},
art_number = {177002},
note = {cited By (since 1996) 0},
url = {http://www.scopus.com/inward/record.url?eid = 2-s2.0-70350430173&partnerID = 40&md5 = 92279497e0f8907c1072af25752dc418},
affiliation = {Laboratoire de Physique des Solides, UMR8502, Université, Paris-Sud, Bâtiment 510, 91405 ORSAY Cedex, France},
abstract = {We use microwave excitation to elucidate the dynamics of long superconductor-normal metal-superconductor Josephson junctions. By varying the excitation frequency in the range 10 MHz-40 GHz, we observe that the critical and retrapping currents, deduced from the dc voltage versus dc current characteristics of the junction, are set by two different time scales. The critical current increases when the ac frequency is larger than the inverse diffusion time in the normal metal, whereas the retrapping current is strongly modified when the excitation frequency is above the electron-phonon rate in the normal metal. Therefore the critical and retrapping currents are associated with elastic and inelastic scattering, respectively. 2009 The American Physical Society.},
document_type = {Article},
source = {Scopus}}