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@CONFERENCE{Reulet2004244,
author = {Reulet, B., Spietz, L., Wilson, C.M., Senzier, J., Prober, D.E.},
title = {Measurement of non-Gaussian shot noise: Influence of the environment},
journal = {Proceedings of SPIE - Fluctuations and Noise in Materials},
year = {2004},
volume = {5469-33:},
pages = {244-256},
note = {cited By (since 1996) 2},
url = {http://www.scopus.com/inward/record.url?eid = 2-s2.0-4344629756&partnerID = 40&md5 = 08dd27b7a6c4fe416488717f3cac1101},
affiliation = {Department of Applied Physics, Yale University, New Haven, CT 06520-8284, United States; Laboratoire de Physique des Solides, UMR8502, Université Paris-Sud, 91405 Orsay, France},
abstract = {We present the first measurements of the third moment of the voltage fluctuations in a conductor. This technique can provide new and complementary information on the electronic transport in conducting systems. The measurement was performed on non-superconducting tunnel junctions as a function of voltage bias, for various temperatures and bandwidths up to 1GHz. The data demonstrate the significant effect of the electromagnetic environment of the sample.},
author_keywords = {Counting statistics; Environment; Higner moments; Non-Gaussian noise; Quantum noise; Shot noise; Third cumulant; Tunnel junction},
document_type = {Conference Paper},
source = {Scopus}}